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  1. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Manoj Sachdev
    Springer US
    Ebook
    Sofort lieferbar

    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to...

    213,99 € Ebook
    Alle Preise inkl. MwSt
  2. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    Andrei Pavlov
    Springer Netherland
    Ebook
    Sofort lieferbar

    PSTRONG CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesSTRONGcove...

    160,49 € Ebook
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  3. Thermal and Power Management of Integrated Circuits
    Thermal and Power Management of Integrated Circuits
    Arman Vassighi
    Springer US
    Ebook
    Sofort lieferbar

    P In Thermal and Power Management of Integrated Circuits, power and thermal management issues in...

    96,29 € Ebook
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  4. ESD Protection Device and Circuit Design for Advanced CMOS Technologies
    ESD Protection Device and Circuit Design for Advanced CMOS Technologies
    Oleg Semenov
    Springer Netherland
    Ebook
    Sofort lieferbar

    PEM ESD Protection Device and Circuit Design for Advanced CMOS TechnologiesEMis intended f...

    171,19 € Ebook
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